Nilsson, in Applications of Synchrotron Radiation, ed. Muilenberg (eds.), Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer Corporation, Eden Prairie, 1979) This process is experimental and the keywords may be updated as the learning algorithm improves.Ĭ.D. These keywords were added by machine and not by the authors. Thereby, the discussion focusses mainly on the characterization of semiconductor nanocrystals. In this chapter different possibilities to perform photoemission experiments and the different kinds of obtainable information are shortly reviewed. In particular the latter can reveal detailed information such as the local environment of elements at the surface of a sample, because synchrotron XPS can usually be performed with significantly improved resolution. XPS experiments can be performed with classical X-ray tubes, but also with the use of synchrotron radiation. Due to the short path length which the electrons can travel in matter without scattering, detecting photoelectrons probes the surface properties of the sample. A powerful method to investigate inorganic or organic thin films and also the surface of semiconductor nanocrystals is X-ray photoelectron spectroscopy (XPS), where incident X-rays lead to the emission of photoelectrons from a sample. Many physical and chemical properties of nanostructured materials depend on surfaces and interfaces.
